Surface Science

Intertek MSG Surface Science Analytical Laboratory

The Intertek MSG Surface Science team uses state of the art capability to characterize the elemental, chemical and molecular composition of surfaces and buried interfaces. Intertek expertise provides a reliable, experienced and professional characterisation service to a wide range of industrial and academic customers.

The surface analysis team offers consultancy, expert witness, fundamental research, product development, problem solving and data generation services.

Intertek MSG Surface Science Methods:

• X-Ray Photoelectron Spectroscopy (‘XPS’, also known as ‘ESCA’ - Electron Spectroscopy for Chemical Analysis) using the Kratos ‘Axis Ultra’ instrument
• Static Secondary Ion Mass Spectrometry (SSIMS) using the IonTof ‘ToFSIMS IV - 200’ and PHI ‘7200’ instruments
• 2-D imaging (XPS & SSIMS)
• Depth profiling (XPS, Angle-resolved XPS, DSIMS)
• Imaging depth profiling, ‘3-D imaging’ (DSIMS)

Applications of Surface Analysis:

• Quantitative elemental identification
• Quantitative and qualitative chemical analysis (functional groups, oxidation state, bonding etc.)
• Molecular identification and relative quantification
• Characterization of thin films and coatings
• Imaging of coating distribution and homogeneity, for example on films, textile fibres, skin and hair
• 'Plane of failure' analysis for coatings, adhesive joints, printed materials or complex laminates such as packaging materials
• Temperature-programmed analysis to study binding energetics, desorption kinetics, phase transitions etc.
• Bulk analysis taking advantage of special features of the techniques, for example Cr VI determination, trace analysis
• Quality Control
• Characterization of sheet, films, fibres, particles and liquids
• Biomaterials, Foodstuffs
• Nanotechnology, MEMS
• Organic electronics, Semiconductors
• Pharmaceutical, Medical Devices, Personal Care
• Aerospace, Automotive

The MSG advantage:

• Combined state of the art equipment capability in XPS and SSIMS with over 50 years experience of surface analysis, problem solving and materials characterization
• Fully confidential, quality assured service with ISO 17025 accreditation for both SSIMS and XPS
• Professional, dependable, responsive, high quality service
• 'While-U-Wait' service to long term projects
• SSIMS analysis with cluster and polyatomic ion sources including Gold, Bismuth, SF 5 + and C 60 + gives enhanced signal levels for analysis of molecular species giving more specific results and making the previously impossible possible!
• Analysis of volatile or mobile materials and biomaterials
• Instrument automation for high throughput screening