Optical Light Microscopy:

• Optical light microscopes employ the visible or near-visible portion of the electromagnetic spectrum. Applications include use in the life sciences, metallurgy and electronic industries.

SEM Scanning Electron Microscopy:

• The Scanning Electron Microscope (SEM) analyses the surface of solid objects, producing images of higher resolution than optical microscopy. Depth resolution of 0.5 to 3.0 µm.
• Cryo_EM Microscopy

SEM Energy Dispersive X-ray Analysis:

• SEM/EDXA analysis of small particles by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDXA) is possible without destruction or injury to the sample. Depth resolution of 0.5 to 3.0 µm.

TEM Transmission Electron Microscopy:

• TEM is used for ultra structural characterisation of a wide range of samples. Applications include morphology, crystallographic and compositional information.
• TEM biological samples analysis.

STM Scanning Tunnelling Microscopy:

• Scanning Tunnelling Micrsocopy (STM) measures weak electrical current flowing between the probe tip and sample as they are separated at a distance, generating atomic level images of metallic substrates.

Confocal Laser Scanning Microscopy:

• Confocal Laser Scanning Microscopy

X-Ray Photoelectron Microscopy:

• XPS determines surface elemental and functional group composition. XPS provides chemical state information from the first few atomic layers at the sample surface. Depth resolution of 20 to 200 Å in profiling mode, 10 to 100 Å with surface analysis.

EDX - Energy Dispersive X-Ray

• EDX, EDAX, EDS

SPM Scanning Probe Microscopy (AFM):

• Scanning Probe Microscopy(SPM) studies surface topology and physical properties on a nanometre scale. Surface imaging is to near-atomic resolution, measuring atomic level forces at the sample surface. SPM measures weak electrical current flowing between the probe tip and sample as they are separated at a distance. SPM is also referred to as AFM or Atomic Force Microscopy. Depth resolution of 0.1 Å.

Vertical Scanning, Phase Shifting Interferometry:

• Vertical scanning interferometry (VSI) is a non-invasive technique used to quantify surface topography of solids.

AES Auger Electron Spectroscopy:

• AES is able to determine composition of the top few layers of a surface. Depth resolution of 20 to 200 Å in profiling mode, 30 Å with surface analysis.

X-Ray Diffraction Analysis (XRD):

• XRD is the primary tool for investigating the structure of crystalline materials, from atomic arrangement to crystallite size and imperfections.