Optical Light Microscopy:

• Optical light microscopes employ the visible or near-visible portion of the electromagnetic spectrum. Applications include use in the life sciences, metallurgy and electronic industries.

SEM Scanning Electron Microscopy:

• The Scanning Electron Microscope (SEM) analyses the surface of solid objects, producing images of higher resolution than optical microscopy. SEM produces representations of three-dimensional samples from a diverse range of materials. Techniques include cathode-luminescence and back-scattering for surface, contrast and elemental analysis.

SEM Energy Dispersive X-ray Analysis:

• SEM/EXDA analysis of small particles by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDXA) is possible without destruction or injury to the sample. SEM/EXDA provides qualitative elemental analysis and element localisation on samples being analysed.

SSIMS Static Secondary Ion Mass Spectrometry:

• SSIMS allows molecular identification and thin film characterization of organic and inorganic materials on surfaces.

TEM Transmission Electron Microscopy:

• TEM is used for ultra structural characterisation of a wide range of samples. Applications include morphology, crystallographic and compositional information, including Biological TEM applications.

AES Auger Electron Spectroscopy:

• AES is a able to determine composition of the top few layers of a surface. AES is sensitive to low atomic number elements and all elements save hydrogen and helium.

XRD X-Ray Diffraction:

• XRD is used for characterizing materials. The technique is used to studying powdery particles, particles in liquid suspensions or polycrystalline solids, including  bulk or thin film materials.

AFM Atomic Force Microscopy:

• AFM studies of surface topology and physical properties on a nanometre scale. Surface imaging is to near atomic resolution, measuring atomic level forces at the sample surface. Van der Waals, electrostatic, capillary, magnetic and ionic forces produce topographical images of the sample.

X-Ray Photoelectron Spectroscopy:

• XPS determines surface elemental and functional group composition. XPS provides chemical state information from the first few atomic layers at the sample surface. XPS allows chemical composition analysis of the surface layer from 5 to 10 nanometers.

SPM Scanning Probe Microscopy:

• SPM measures weak electrical current flowing between the probe tip and sample as they are separated at a distance.

Vertical Scanning, Phase Shifting Interferometry:

• Vertical scanning interferometry (VSI) is a non-invasive technique used to quantify surface topography of solids such as metals, ceramics, minerals, glasses with high precision.